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一种用于大信号测试的矢量校准快速修正方法
引用本文:苏江涛,郭庭铭,刘军,许吉,郑兴.一种用于大信号测试的矢量校准快速修正方法[J].半导体技术,2019,44(8):652-658.
作者姓名:苏江涛  郭庭铭  刘军  许吉  郑兴
作者单位:杭州电子科技大学射频电路与系统教育部重点实验室,杭州 310018;浙江省大规模集成电路设计重点实验室,杭州 310018;杭州电子科技大学射频电路与系统教育部重点实验室,杭州,310018
基金项目:国家自然科学基金;国家自然科学基金;国家自然科学基金;国家自然科学基金;浙江省自然科学基金;浙江省自然科学基金;浙江省自然科学基金;国家重点实验室开放基金
摘    要:大信号测试系统是评估GaN功率器件的非线性特性的重要手段,而精准的矢量校准是获得稳定可信测试数据的第一步。为了解决毫米波频段矢量校准易随时间增加而失效的难题,对不同的校准方法进行了讨论,并以直通-反射-匹配负载(TRM)校准方法为基础,对校准过程中的误差系数随时间变化的趋势进行了数据分析,提出了一种可以实时快速修正校准模型中误差系数的方法。采用这种方法,失效的校准状态可以在1 min内得到快速修正而恢复初始校准状态;矢量校准的时间稳定度与传统方法相比,可延长10倍以上。该方法有力地保证了大信号测试中数据的一致性,可广泛应用于器件建模和电路设计等领域。

关 键 词:GaN器件  负载牵引  矢量校准  直通-反射-匹配负载(TRM)校准技术  矢量网络分析仪(VNA)

A Vector Calibration Fast Correction Method for Large Signal Measurement
Su Jiangtao,Guo Tingming,Liu Jun,Xu Ji,Zheng Xing.A Vector Calibration Fast Correction Method for Large Signal Measurement[J].Semiconductor Technology,2019,44(8):652-658.
Authors:Su Jiangtao  Guo Tingming  Liu Jun  Xu Ji  Zheng Xing
Institution:(RF Circuits and System Key Laboratory of Ministry of Education,Hangzhou Dianzi University,Hangzhou 310018,China;Zhejiang Key Laboratory of Large-Scale Integrated Circuit Design,Hangzhou 310018,China)
Abstract:The large-signal measurement system is an important method for evaluating the nonlinear performance of GaN power devices, and accurate vector calibration is the first step in obtaining stable and reliable test data. In order to solve the issue that vector calibration is easy to lose effectiveness with time at millimeter wave band, different calibration methods were discussed. Based on the thru-reflect-match(TRM) calibration method, the data analysis of the variation trend of error coefficients with time in the calibration process was carried out, and a method for quickly correcting the drift error coefficients in the calibration model was proposed. With this method, the failed calibration state can be quickly corrected within 1 min to return to the initial calibration state. Therefore, the time stability of vector calibration can be extended by more than 10 times compared with the traditional method. The proposed method effectively guarantees the consistency of data in large signal measurement, hence can be widely applied in device modelling and circuit design.
Keywords:GaN device  load pull  vector calibration  thru-reflect-match(TRM) calibration technique  vector network analyzer(VNA)
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