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Simultaneous X‐ray fluorescence and scanning X‐ray diffraction microscopy at the Australian Synchrotron XFM beamline |
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| Authors: | Michael W M Jones Nicholas W Phillips Grant A van Riessen Brian Abbey David J Vine Youssef S G Nashed Stephen T Mudie Nader Afshar Robin Kirkham Bo Chen Eugeniu Balaur Martin D de Jonge |
| Institution: | 1. Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria3168, Australia;2. ARC Centre of Excellence in Advanced Molecular Imaging, La Trobe Institute for Molecular Sciences, La Trobe University, Victoria3086, Australia;3. CSIRO Manufacturing, Parkville, Victoria3052, Australia;4. Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, Victoria3086, Australia;5. X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL60439, USA;6. Mathematics and Computer Science Division, Argonne National 7. Laboratory, Argonne, IL60439, USA;8. CSIRO Manufacturing, Clayton, Victoria3168, Australia |
| Abstract: | Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X‐ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X‐ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super‐resolved ultra‐structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step‐ and fly‐scanning modes, robust, simultaneous XFM‐SXDM is demonstrated. |
| Keywords: | X‐ray fluorescence scanning X‐ray diffraction microscopy ptychography |