Non‐negative matrix factorization for the near real‐time interpretation of absorption effects in elemental distribution images acquired by X‐ray fluorescence imaging |
| |
| Authors: | Matthias Alfeld Mirwaes Wahabzada Christian Bauckhage Kristian Kersting Gerd Wellenreuther Pere Barriobero-Vila Guillermo Requena Ulrike Boesenberg Gerald Falkenberg |
| |
| Affiliation: | 1. Deutsches Elektronen-Synchrotron DESY, Notkestra?e 85, Hamburg22607, Germany;2. INRES – Pflanzenkrankheiten und Pflanzenschutz, Universit?t Bonn, Meckenheimer Allee 166a, Bonn53115, Germany;3. Fraunhofer IAIS, Schloss Birlinghoven, Sankt Augustin53757, Germany;4. Computer Science Department, TU Dortmund University, Joseph-von-Fraunhofer-Stra?e 23, Dortmund44227, Germany;5. European XFEL GmbH, Albert-Einstein-Ring 19, Hamburg22761, Germany;6. Institute of Materials Science and Technology, Vienna University of Technology, Karlsplatz 13/E308, Vienna1040, Austria;7. Institute of Materials Research, German Aerospace Center, Linder H?he, K?ln51147, Germany |
| |
| Abstract: | Elemental distribution images acquired by imaging X‐ray fluorescence analysis can contain high degrees of redundancy and weakly discernible correlations. In this article near real‐time non‐negative matrix factorization (NMF) is described for the analysis of a number of data sets acquired from samples of a bi‐modal α+β Ti‐6Al‐6V‐2Sn alloy. NMF was used for the first time to reveal absorption artefacts in the elemental distribution images of the samples, where two phases of the alloy, namely α and β, were in superposition. The findings and interpretation of the NMF results were confirmed by Monte Carlo simulation of the layered alloy system. Furthermore, it is shown how the simultaneous factorization of several stacks of elemental distribution images provides uniform basis vectors and consequently simplifies the interpretation of the representation. |
| |
| Keywords: | micro‐XRF data analysis non‐negative matrix factorization NMF Ti alloys |
|
|
