Progress in the field of Kossel and pseudo-Kossel technique

A review of new methods and equipments of Kossel and pseudo-Kossel technique is given. The importance of line profiles for crystal and real structure analysis is stressed. The state of the art for determination of crystallographic parameters is described, and future trends (assessment of dislocation density, investigation of radiation defects) are discussed. A very important application is the optimization of the technology for transformer core sheets.Dedicated to Professor Günther Tölg on the occasion of his 60th birthday