Study of quasicrystalline thin films based on Al–Pd–Mn and Al–Cu–Fe prepared by PLD期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Study of quasicrystalline thin films based on Al–Pd–Mn and Al–Cu–Fe prepared by PLD

Authors:	J. Šonský M. Jelínek L. Jastrabík V. Studnička D. Chvostová Z. Bryknar

Affiliation:	J. onský, M. Jelínek, L. Jastrabík, V. Studnika, D. Chvostová and Z. Bryknar

Abstract:	Thin films of Al₇₀Pd₂₀Mn₁₀ Al₆₃Cu₂₅Fe₁₂ Al₇₀Pd₂₀Mn₁₀ and Al₆₃Cu₂₅Fe₁₂ were grown by laser ablation on fused silica at set of deposition temperature –196°C, room temperature 165°C and 350°C. Structure, morphology, resistivity and refractive index of prepared layers were studied.

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