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A1.3 μm strained quantum well laser on a graded InGaAs buffer with a GaAs substrate
Authors:T Uchida  H Kurakake  H Soda  S Yamazaki
Institution:(1) Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, 243-01 Atsugi, Japan;(2) Fujitsu Limited, 1015 Kamikodanaka, 211 Kawasaki, Japan
Abstract:We grew a 1.3 μm strained-layer quantum well (SL-QW) laser with InGaP cladding layers on a lattice-relaxation buffer layer by metalorganic vapor phase epitaxy. For the lattice-relaxation buffer, we used a compositionally graded InGaAs/GaAs structure. The significantly reduced surface roughness of the InGaP cladding layers achieved by supplying a large amount of H2Se enables CW operation of our 1.3 μm SL-QW laser. We achieved a low threshold current of less than 10 mA and a high characteristic temperature of 100K around room temperature.
Keywords:Characteristic temperature  compositionally graded layer  InGaAs/GaAs  laser  lattice relaxation  metalorganic vapor phase epitaxy (MOVPE)  quantum well (QW)  Se
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