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Speciation of activators in electroluminescent thin films: an EXAFS study of cerium and terbium doped strontium sulfide |
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| Authors: | Yves Charreire Robert Cortes E Nykänen L Niinistö P Soininen Markku Leskelä |
| Institution: | University of Versailles, 45 Av. des Etats Unis, F-78035 Versailles, France, FR LURE, Université de Paris-Sud XI, Bat. 209, F-91405 Orsay, France, FR Laboratory of Inorganic and Analytical Chemistry, Helsinki University of Technology, P.O. Box 6100, FIN-02015 Espoo, Finland, FI Department of Chemistry, University of Helsinki, P.O. Box 55, FIN-00014 Helsinki, Finland, FI |
| Abstract: | Extended X-ray absorption fine structure (EXAFS) was used to determine the local structure of the luminescent centers in Tb3+ and Ce3+ -doped strontium sulfide thin films deposited by Atomic Layer Epitaxy (ALE). The rare earths were observed to enter mainly the substitutional sites but at the same time a part of the atoms form RES clusters (RE = rare earth). The presence of both substitutional sites and RES clusters has been observed for the first time in this study for rare earths in II–VI compounds. |
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