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| Growth stages of YSZ-buffer layers and YBa2Cu3O7−x thin films on silicon substrates studied by scanning probe microscopy | |
| 摘 要： | |
| 收稿时间： | 17 December 1993 |
| 修稿时间： | 15 March 1994 |
| 本文献已被 SpringerLink 等数据库收录！ | |
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