| ICP-AES法测定碲锭中Al、Ag、Bi、Cu、Cd等13个杂质元素 |
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| 引用本文： | 张桂广,马立奎. ICP-AES法测定碲锭中Al、Ag、Bi、Cu、Cd等13个杂质元素[J]. 光谱实验室, 2000, 17(1): 95-97 |
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| 作者姓名： | 张桂广 马立奎 |
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| 作者单位： | 1. 韶关出入境检验检疫局,广东省韶关市站南路口岸综合大楼,512023
2. 核工业华南地质研究院,广东省韶关市,512026 |
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| 摘 要： | 本文介绍了采用电感耦合等离子体发射光谱法（ＩＣＰ－ＡＥＳ）测定碲锭中Ａｌ、Ａｇ、Ｂｉ、Ｃｕ、Ｃｄ 等１３ 个杂质元素的方法。采用离峰扣背景法校正了碲基体的干扰，测定结果令人满意。
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| 关 键 词： | 碲锭 杂质元素 ICP-AES |
| 文章编号： | 1004-8138(2000)01-0095-03 |
| 修稿时间： | 1999-09-01 |
Determination of Al,Ag,Bi,Cu,Cd etc.13 Elements in Tellurium Ingot by ICP-AES |
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| ZHANG Gui-Guang,MA Li-Kui. Determination of Al,Ag,Bi,Cu,Cd etc.13 Elements in Tellurium Ingot by ICP-AES[J]. Chinese Journal of Spectroscopy Laboratory, 2000, 17(1): 95-97 |
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| Authors: | ZHANG Gui-Guang MA Li-Kui |
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| Abstract: | A method for determination of Al,Ag,Bi,Cu,Cd,Co,Fe,Ni,Pb,Mg,Sn,Se,Zn in tellurium ingot by ICP AES were studied.The interference of the matrix have been corrected by off peak background correction method,satisfactory results were obtained. |
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| Keywords: | Tellurium Ingot Impurity Element ICP AES. |
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