Mechanism of the transport of nickel along a Si(111) surface in the presence of adsorbed cobalt atoms |
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Authors: | A E Dolbak B Z Ol’shanetskii S A Tiis |
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Institution: | (1) Institute of Semiconductor Physics, Siberian Branch of the, Russian Academy of Sciences, 630090 Novosibirsk, Russia |
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Abstract: | The mechanism of the transport of nickel along a Si(111) surface in the presence of adsorbed cobalt atoms is established by
LEED and Auger electronic spectroscopy. The mechanism consists of diffusion of nickel atoms through the bulk and segregation
of the atoms on the surface during annealing. This mechanism of nickel transport plays the governing role at temperatures
below 700°C, where nickel transport along clean silicon surfaces is not observed. It is found that the nickel segregation
factor is what determines the lowest temperature at which nickel transport is observed on clean silicon surfaces.
Pis’ma Zh. éksp. Teor. Fiz. 69, No. 6, 423–425 (25 March 1999) |
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