首页 | 本学科首页   官方微博 | 高级检索  
     


Lanthanoid‐Based Ionic Liquids Incorporating the Dicyanonitrosomethanide Anion
Authors:Dr. Anthony S. R. Chesman  Mei Yang  Nicolas D. Spiccia  Prof. Dr. Dr. Glen B. Deacon  Prof. Dr. Stuart R. Batten  Prof. Dr. Anja‐Verena Mudring
Affiliation:1. School of Chemistry, Monash University, Clayton, Victoria 3800 (Australia), Fax: (+61)?3‐9905‐4597 http://www.chem.monash.edu.au/staff/sbatten/index.html;2. Anorganische Chemie I – Festk?rperchemie und Materialien, Ruhr Universit?t Bochum, 44780 Bochum (Germany), Fax: (+49)?234‐32‐14951 http://www.anjamudring.de;3. CSIRO Materials Science and Engineering, Bayview Ave, Clayton, Victoria 3169 (Australia)
Abstract:A series of low‐melting‐point salts with hexakisdicyanonitrosomethanidolanthanoidate anions has been synthesised and characterised: (C2mim)3[Ln(dcnm)6] ( 1 Ln ; 1 Ln = 1 La , 1 Ce , 1 Pr , 1 Nd ), (C2C1mim)3[Pr(dcnm)6] ( 2 Pr ), (C4C1pyr)3[Ce(dcnm)6] ( 3 Ce ), (N1114)3[Ln(dcnm)6] ( 4 Ln ; 4 Ln = 4 La , 4 Ce , 4 Pr , 4 Nd , 4 Sm , 4 Gd ), and (N1112OH)3[Ce(dcnm)6] ( 5 Ce ) (C2mim=1‐ethyl‐3‐methylimidazolium, C2C1mim=1‐ethyl‐2,3‐dimethylimidazolium, C4C1py=N‐butyl‐4‐methylpyridinium, N1114=butyltrimethylammonium, N1112OH=2‐(hydroxyethyl)trimethylammonium=choline). X‐ray crystallography was used to determine the structures of complexes 1 La , 2 Pr , and 5 Ce , all of which contain [Ln(dcnm)6]3? ions. Complexes 1 Ln and 2 Pr were all ionic liquids (ILs), with complex 3 Ce melting at 38.1 °C, the lowest melting point of any known complex containing the [Ln(dcnm)6]3? trianion. The ammonium‐based cations proved to be less suitable for forming ILs, with complexes 4 Sm and 4 Gd being the only salts with the N1114 cation to have melting points below 100 °C. The choline‐containing complex 5 Ce did not melt up to 160 °C, with the increase in melting point possibly being due to extensive hydrogen bonding, which could be inferred from the crystal structure of the complex.
Keywords:dicyanonitrosomethanide  ionic liquids  lanthanides  thermal properties  X‐ray diffraction
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号