Behavioral test generation modeling approach for mixed-signal IC verification |
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Authors: | Veikko Loukusa |
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Affiliation: | Nokia Mobile Phones, Yrttipellontie 10, Oulu 90230, Finland |
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Abstract: | An application of behavioral modeling for mixed-signal test generation and applied results are presented. It is shown that test debugging can be provided in the verification test system before silicon by utilizing simulated behavioral mixed-signal models. Due to the behavioral modeling technique, the computational performance was enhanced to a level allowing efficient test development and debugging. Influence on efficiency in design methods is reported. |
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Keywords: | Mixed-signal Test generation Test debug Behavioral model Top-level simulation |
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