A new method for the determination of the thickness and the refractive index of thin dielectric films evaporated on metal substrates |
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| Authors: | IN ShklyarevskiiAFA El-Shazly E Idczak |
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| Institution: | Faculty of Physics, A.M. Gorki State University, Kharkov, Ukraine |
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| Abstract: | A new ellipsometrical method for the accurate determination of the thickness and the refractive index and hence the dispersion for thin transparent films evaporated on metal substrates is put forward. Results for zinc sulphide thin films evaporated in vacuum, 10−5 mm Hg, on antimony are reported. |
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