Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode

By combination of very small primary ion current densities (10⁻⁹ A·cm⁻²) on a large target area (0.1 cm²) and ultra high vacuum conditions (10⁻¹⁰ torr range) the secondary ion emission of an individual uppermost monolayer of a solid can be observed for several hours. This “statical method of secondary ion mass spectroscopy” (SIMS) is shown to be a powerful tool for the analysis of chemical reactions at the surface of a solid. The method is demonstrated using as an example the initial surface oxidation of metals.