Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis |
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| Institution: | 1. Department of Mechanical and Industrial Engineering, College of Engineering, Qatar University, P. O. Box 2713, Doha, Qatar;2. Department of Applied Physics, Delhi Technological University, Delhi, India;3. Department of Mechanical Engineering, Washkewicz College of Engineering, Cleveland State University, 1960 E. 24th St., FH232 Cleveland, OH, USA;4. Department of Metallurgical and Materials Engineering, MNIT, PB-302017, Jaipur, India;1. Westfälische Wilhelms-Universität Münster, Institut für Anorganische und Analytische Chemie, Corrensstraße 30, 48149 Münster, Germany;2. Helmholtz Zentrum München, Institut für Pathologie — Abteilung Analytische Pathologie, Ingolstädter Landstraße 1, 85764 Neuherberg, Germany;3. Technische Universität München, Institut für Allgemeine Pathologie und Pathologische Anatomie, Trogerstraße 18, 81675 München, Germany;4. Universitätsklinikum Freiburg, Institut für Klinische Pathologie, Breisacher Straße 115a, 79106 Freiburg, Germany;5. European Virtual Institute for Speciation Analysis (EVISA), Mendelstraße 11, 48149 Münster, Germany;1. Institute of Inorganic and Analytical Chemistry, University of Münster, Corrensstraße 30, 48149 Münster, Germany;2. Experimental Transplant Hepatology, University Hospital Münster, Albert-Schweitzer-Straße 1, 48149 Münster, Germany;3. Institute of Molecular Toxicology and Pharmacology, Helmholtz Center Munich, Ingolstädter Landstraße 1, 85764 Neuherberg, Germany;4. European Virtual Institute for Speciation Analysis (EVISA), Mendelstraße 11, 48149 Münster, Germany;5. Department of Pathology, University Hospital Münster, Domagkstraße 17, 48149 Münster, Germany;6. Institute of Toxicology and Environmental Hygiene, Technical University Munich, Biedersteinerstraße 29, 80802 München, Germany;1. School of Material Science and Engineering, Beijing Institute of Technology, 100081 Beijing, PR China;2. State Key Laboratory of Oncology in South China, Collaborative Innovation Center of Cancer Medicine, Sun Yat-Sen University Cancer Center, Guangzhou, PR China |
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| Abstract: | A one-step sample preparation by electro-deposition for total-reflection X-ray fluorescence (TXRF) analysis has been developed using a common three-electrode arrangement with a rotating disc as the working electrode. Several elements such as Cr, Mn, Fe, Co, Ni, Cu, Zn, Ag, Cd, Pb, As and U have been determined simultaneously in saline matrix. A special electrode tip has been constructed as a holder for the TXRF sample carrier, which consists of polished glassy carbon. The influence of parameters such as time, pH value, and trace element concentration on the deposition yield has been examined for 14 elements. From repeatability studies, the uncertainty in deposition yields at the 95% confidence level has been found to be less than 20% for most of these elements. Typical detection limits range from 5 to 20 ng/l under the experimental conditions applied here. By an appropriate choice of the reference element and by calculation of yield factors, reliable quantification can be achieved directly by internal standardization. First results obtained for the standard reference material CRM 505 are presented. |
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