Development of a Seebeck coefficient Standard Reference Material |
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| Authors: | Nathan D Lowhorn W Wong-Ng Z Q Lu E Thomas M Otani M Green N Dilley J Sharp and T N Tran |
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| Institution: | (1) Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA;(2) Statistical Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA;(3) Quantum Design, San Diego, CA 92126, USA;(4) Marlow Industries, Inc., Dallas, TX 75238, USA;(5) Naval Surface Warfare Center, Bethesda, MD 20817, USA |
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| Abstract: | We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is crucial for inter-laboratory data comparison and for instrument calibration. Certification measurements were performed
using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient
values are provided from 10 to 390 K. The availability of this SRM will validate the measurement accuracy, leading to a better
understanding of the structure/property relationships, and the underlying physics of new and improved thermoelectric materials.
An overview of the measurement techniques and data analysis is given. |
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| Keywords: | PACS" target="_blank">PACS 66 70 Df 72 15 Jf 72 15 Eb 72 00 00 72 15 -v |
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