| Abstract: | Fractional density of states(FDOS) hinders the accurate measuring of the overall spontaneous emission(SE)control ability of a three-dimensional(3 D) photonic crystal(PC) with the current widely used SE decay lifetime measurement systems. Based on analyzing the FDOS property of a 3 D PC from theory and simulation,the excitation focal spot position averaged FDOS with a distribution broadening parameter was proposed to accurately reflect the overall SE control ability of the 3 D PC. Experimental work was done to confirm that our proposal is effective, which can contribute to comprehensively characterizing the SE control performance of photonic devices with quantified parameters. |
