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A comparison of ionizing radiation damage in CMOS devices from ^60Co gamma rays,electrons and protons |
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| Authors: | HE Bao-Ping YAO Zhi-Bin ZHANG Feng-Qi |
| Affiliation: | Northwest Institute of Nuclear Technology, Xi'an 710613, China) |
| Abstract: | gamma rays, electrons, protons, radiation damage |
| Keywords: | gamma rays electrons protons radiation damage |
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