(1) Institute of Molecular Crystal Physics, Ufa Scientific Center, Russian Academy of Sciences, pr. Oktyabrya 151, Ufa, 450054, Bashkortostan, Russia;(2) Bashkortostan State University, ul. Frunze 32, Ufa, 450074, Bashkortostan, Russia
Abstract:
Secondary-ion mass spectrometry is applied to determine the elemental composition of thin diamond-like films produced on silicon substrates by high-vacuum deposition from ion beams. Qualitative analysis and comparison of the results with the data gained for graphite and pyrocarbon standard samples indicate a high chemical purity for the diamond-like coatings obtained.