The growth of crystalline vapor deposited carbon-60 thin films

Thin films (25-2500 Å) of C₆₀ molecules have been deposited on both (001) NaCl and mica substrates at varying temperatures by resistive evaporation. Both electron diffraction and high resolution microscopy have been used to assess the degree of crystallinity, the orientational ordering and the nature of the defects present in these face-centered-cubic films. For NaCl, optimum conditions yielded polycrystalline films with a tendency towards a 110 orientation, while for mica, extended single crystal films have been fabricated which exhibit a 111 direction normal to the film surface.