Application of generalized standard additions method to inductively coupled plasma atomic emission spectroscopy with an echelle spectrometer and segmented-array charge-coupled detectors |
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| Institution: | 1. Center for Analysis, Measurement and Computing, Harbin Institute of Technology, Harbin 150001, PR China;2. School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, PR China;3. Key Laboratory of Superlight Materials and Surface Technology, Ministry of Education, College of Materials Science and Chemical Engineering, Harbin Engineering University, Harbin 150001, PR China |
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| Abstract: | Simultaneous correction for both spectral interferences and matrix effects in inductively coupled plasma atomic emission spectrometry can be accomplished by using the generalized standard additions method (GSAM). Results obtained with the application of the GSAM to the Perkin-Elmer Optima 3000 ICP atomic emission spectrometer are presented. The echelle-based polychromator with segmented-array charge-coupled device detectors enables the direct, visual examination of the overlapping lines Cd(I) 228.802 nm and As(I)228.812 nm. The slit translation capability allows a large number of data points to be sampled; therefore, the advantage of noise averaging is gained. Pure spectra of each of the spectrally active components in the sample can be extracted through the GSAM calculation. |
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