|
|||||
|
|
Rietveld refinement of the structures of dry-synthesized MFeIIISi2O6 leucites (M = K,Rb, Cs) by synchrotron X-ray powder diffraction |
|
| Authors: | A M T Bell C M B Henderson |
| Abstract: | |
| Keywords: | |
|
||||||||||||||||
|
||||||||||||||||
|
||||||||||||||||
|
|
|
|
| 设为首页 | 免责声明 | 关于勤云 | 加入收藏 |
|
Copyright©北京勤云科技发展有限公司 京ICP备09084417号 |