The influence of the spectral asymmetry of X-ray emission lines on the results of studying defects in crystals by X-rays of different wavelength |
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| Authors: | Adéla Kochanovská |
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| Affiliation: | (1) Institute of Technical Physics, Czechosl. Acad. Sci., Prague |
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| Abstract: | Since the asymmetry of X-ray emission lines was found to influence the exact measurements of lattice parameters of powdered samples the author has revised the results she once obtained when carrying out exact measurements of the lattice parameter with radiations of various wavelengths for tungsten crystals containing admixtures of different elements. It is shown that with samples having an inhomogeneous distribution of the admixtures in the crystals the typical graphs of lattice parameter found originally remain when respecting the influence of the spectral asymmetry. On the other hand, with a sintered sample which has been homogeneized by long annealing the introduction of corrections to spectral asymmetry leads to an adjustment of the differences measured originally, for which it was difficult to find a probable explanation.
                           
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