Total emissivity measurements without use of an absolute reference

Total emissivity measurement by ordinary steady state radiometric methods are difficult at low temperature; besides, those methods require an emissivity reference. In this paper, several new periodic methods suitable for total emissivity measurements are presented. First it is shown that the thermal modulation of a sample allows direct emissivity measurements, even at low temperature, with an ordinary equipment involving no cooled vessel. Very accurate measurements have been performed within a few minutes at room temperature, on reflective materials. Second, it is shown that indirect total emissivity measurements are also feasible, provided source and sample temperatures are equal. This condition can be fulfilled with a modulated temperature hemispherical gray surface as IR source, or in a simpler way, with a mobile part of a hemisphere. Third, it is shown that if both sample and source temperatures are modulated, simultaneous direct and indirect measurements can be carried out. This results in an absolute emissivity measurement without reference. As an experimental validation, simultaneous direct and indirect measurements of the total directional emissivity are carried out on three samples at room temperature. Periodic radiometry methods are found to be reliable and accurate, emission and reflection measurements giving the same result.