Scattering and diffraction of a plane wave by a randomly rough half-plane*

Abstract

The scattering and diffraction of a TE (transverse electric) plane wave by a randomly rough half-plane are studied by a combination of three techniques: the Wiener-Hopf technique, the small perturbation method and a probabilistic method based on the shift-invariance of a homogeneous random function. By use of the D^a-Fourier transformation based on the shift-invariance, it is shown that the scattered wave is written by an inverse Fourier transformation of a homogeneous random function with a complex parameter. For a small rough case, such a random function with a complex parameter is expanded in a perturbation series and then the first-order solution is obtained exactly in an integral form. The first-order solution involves two physical processes such that the edge-diffracted wave is scattered by the randomly rough plane and the scattered wave, due to roughness, is diffracted by the half-plane. The solution is transformed into a sum of the Fresnel integrals with complex arguments, an integral along the steepest descent path and a branch-cut integral, which are evaluated numerically. Then, intensities of the coherently scattered wave and incoherent wave are calculated in the region near the edge and illustrated in figures.