紫外ICCD面均匀性测试技术研究

以辐射度学为理论基础,研究了紫外ICCD(UV-ICCD)面的响应均匀性测试技术。论述了200～300nm UV-IOED面均匀性的测试方案。使用入射口径为100μm的光谱仪对UV-ICCD靶面处的均匀性进行了测试。测试结果表明,靶面处辐照度场的不均匀性不高于1.6%。在对靶面处的均匀性进行测试的基础上,对UV-ICCD面的均匀性进行了实际测量,并进行了不确定度分析。结果表明,该方案可应用于UV-ICLD光电探测器件的面均匀性测量。

Research on measuring technique for surface uniformity of the ultraviolet ICCD detector

Based on the theory of radiometry,measuring of surface uniformity of responsibility for ultraviolet CCD detector is researched.A method for measuring the surface uniformity of ultraviolet ICCD detector with 240～280nm is presented.The method of measuring is based on standard deuterium lamp which is calibrated by NIST.At photocathode surface of UV-ICCD, the heterogeneity of irradianee field is less than 1.6 %,which is tested by scientific-grade spectrometer which incident aperture diameter is 100μm.On the basis of uniformity testing result of the irradiance field,the surface uniformity of the ultraviolet IC- CD is tested,and the uncertainty which influences the result of surface uniformity is analyzed.Analyzed results show that this method can be utilized in the measuring of ultraviolet detector's surface uniformity.