| 摘 要： | A method for rapid measuring retardation of a quarter-wave plate based on simultaneous phase shifting technique is presented.The simultaneous phase shifting function is realized by an orthogonal grating,a diaphragm,an analyzer array,and a 4-quadrant detector.The intensities of the light beams fl'om the four analyzers with different azimuths are measured simultaneously.The retardation of the quarter-wave plate is obtained through the four light intensity values.In this method,the major axis position of the quarter-wave plate need not be determined in advance.In addition,the measured result is free of the intensity fluctuation of light source.The feasibility of the method is verified by the experiments.
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