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MOVPE growth of grade-strained bulk InGaAs/InP for broad-band optoelectronic device applications
Authors:Shurong Wang   Wei Wang   Hongliang Zhu   Lingjuan Zhao   Ruiyin Zhang   Fan Zhou   Huiyin Shu  Rufeng Wang
Affiliation:

a National Research Center of Optoelectronic Technology, Institute of Semiconductors, The Chinese Academy of Science, Beijing 100083, People's Republic of China

b Institute of Solar Energy, Yunnan Normal University, Kunming 650092, People's Republic of China

Abstract:In this paper we present a novel growth of grade-strained bulk InGaAs/InP by linearly changing group-III TMGa source flow during low-pressure metalorganic vapor-phase epitaxy (LP-MOVPE).The high-resolution X-ray diffraction (HRXRD) measurements showed that much different strain was simultaneously introduced into the fabricated bulk InGaAs/InP by utilizing this novel growth method. We experimentally demonstrated the utility and simplicity of the growth method by fabricating common laser diodes. As a first step, under the injection current of 100 mA, a more flat gain curve which has a spectral full-width at half-maximum (FWHM) of about 120 nm was achieved by using the presented growth technique. Our experimental results show that the simple and new growth method is very suitable for fabricating broad-band semiconductor optoelectronic devices.
Keywords:A1. Graded-strain   A1. High resolution X-ray diffraction   A3. Metalorganic vapor phase epitaxy   B2. InGaAs   B3. Broadband semiconductor optoelectronic device
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