Damage depth-profiling of Au+ and O+-irradiated amorphous PEEK by monoenergetic positron beams |
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| Authors: | K. Hirata Y. Kobayashi S. Hishita Y. Ujihira |
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| Affiliation: | (1) National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305, Japan (Fax: +81-298/54-4709), JP;(2) National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305, Japan, JP;(3) Research Center for Advanced Science and Technology, The University of Tokyo, Meguro-ku, Tokyo 153, Japan, JP |
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| Abstract: | + and O+ ions was exposed to positron beams to measure the positron annihilation Doppler broadening as a function of the positron energy. As in the previous case of O+-irradiated semicrystalline PEEK, the annihilation lines recorded at relatively low positron energies became broader with increasing irradiation dose. The thickness of the damaged layer estimated from the positron data was compared with the mean depth of the implanted ions calculated by the TRIM code. For the Au+-irradiated samples, some discrepancy was observed between the two quantities. Received: 6 March 1996/Accepted: 19 November 1996 |
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| Keywords: | PACS: 78.70.Bj 61.80.-x |
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