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X-ray and Raman study of spray pyrolysed vanadium oxide thin films |
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| Authors: | A. Bouzidi N. Benramdane S. Bresson C. Mathieu R. Desfeux M. El Marssi |
| Affiliation: | aLaboratoire d’Elaboration et de Caractérisations des Matériaux, département d’électronique, Université Djillali Liabes, BP89, Sidi Bel Abbès 22000, Algeria;bLaboratoire de Physique des Systèmes Complexes, Université Picardie Jules Verne, 33 rue St Leu 80039 Amiens Cedex, France;cUniversité d’Artois, Faculté Jean Perrin, Rue Jean Souvraz, SP18, 62307 Lens, France;dUniversité Lille Nord de France, Université d’Artois, Unité de Catalyse et de Chimie du Solide (UCCS), CNRS UMR 8181, Faculté des Sciences Jean Perrin, Rue Jean Souvraz, SP 18, 62307 Lens Cedex, France;eLaboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, 80039 Amiens, France |
| Abstract: | Vanadium oxide thin films were prepared by spray pyrolysis using solutions of vanadium chloride (VCl3) with different concentrations on glass substrates heated at 200 and 250 °C. The influence of substrate temperature (Ts) and solution concentration (molarity) on structural and vibrational properties is discussed by using X-ray diffraction and Raman spectroscopy. The results revealed that at 0.05 M and Ts = 200 °C, V4O9 thin films are obtained. At 250 °C, V2O5 phases with preferential orientation are observed and the films become polycrystalline when the molarity increases. |
| Keywords: | Thin films Raman spectroscopy Crystallography |
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