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Investigation of aerosol particles by atomic force microscopy
Authors:G. Köllensperger  G. Friedbacher  M. Grasserbauer  L. Dorffner
Affiliation:Institut für Analytische Chemie, Technische Universit?t Wien, Getreidemarkt 9/151, A-1060 Wien, Austria, AT
Institut für Photogrammetrie und Fernerkundung, Technische Universit?t Wien, Gu?hausstra?e 27-29/122, A-1040 Wien, Austria, AT
Abstract:AFM has been applied for studying morphology and size distribution of nanometer-sized particles adsorbed on flat surfaces. In order to optimize imaging of these ultrafine particles different substrates were evaluated with respect to their roughness and stability under the influence of the sensing tip. Moreover, a method for calculating particle volumes from the three-dimensional AFM data is described. This greatly enhances the information content of AFM images, because a large number of particles in the raw data can be evaluated automatically in order to derive information on size distribution or surface coverage. This evaluation method has also been applied successfully to quantitatively describe changes on particles induced by different humidity of the surrounding atmosphere. Received: 15 July 1996 / Revised: 18 December 1996 / Accepted: 3 January 1997
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