Fatigue crack growth simulations of homogeneous and bi-material interfacial cracks using element free Galerkin method |
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Authors: | Himanshu Pathak Akhilendra Singh Indra Vir Singh |
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Institution: | 1. Department of Mechanical Engineering, IIT Patna, India;2. Department of Mechanical and Industrial Engineering, IIT Roorkee, India |
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Abstract: | In this paper, quasi-static fatigue crack growth simulations of homogeneous and bi-material interfacial cracks have been performed using element free Galerkin method (EFGM) under mechanical as well as thermo-elastic load. The thermo-elastic fracture problem is decoupled into thermal and elastic problems. The temperature distribution obtained by solving heat conduction equation is used as input in the elastic problem to get the displacement and stress fields. Discontinuities in the temperature and displacement fields are captured by extrinsic partition of unity enrichment technique. The values of stress intensity factors have been extracted from the EFGM solution by domain based interaction integral approach. The standard Paris fatigue crack growth law has been implemented for the life estimation of various model problems. The results obtained by EFGM under mechanical and thermo-elastic loads were compared with those obtained by FEM using remeshing approach. |
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Keywords: | EFGM Paris law Fatigue Bi-material Interfacial crack Stress intensity factors |
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