Interfacial Roughening in Field Theory |
| |
Authors: | Michael H. K?pf and Gernot Münster |
| |
Affiliation: | (1) Institut für Theoretische Physik, Universit?t Münster, Wilhelm-Klemm-Str. 9, 48149 Münster, Germany |
| |
Abstract: | In the rough phase, the width of interfaces separating different phases of statistical systems increases logarithmically with the system size. This phenomenon is commonly described in terms of the capillary wave model, which deals with fluctuating, infinitely thin membranes, requiring ad hoc cut-offs in momentum space. We investigate the interface roughening in a unified approach, which does not rely on joining different models, namely in the framework of the Landau-Ginzburg model, that is renormalized field theory, in the one-loop approximation. The interface profile and width are calculated analytically, resulting in finite expressions with definite coefficients. They are valid in the scaling region and depend on the known renormalized coupling constant. |
| |
Keywords: | Interfaces Field theory |
本文献已被 SpringerLink 等数据库收录! |
|