Lifetimes of low-lying levels in 18F |
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| Authors: | G.C. Ball T.K. Alexander W.G. Davies J.S. Forster I.V. Mitchell J. Keinonen H.B. Mak |
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| Affiliation: | Atomic Energy of Canada Limited, Chalk River Nuclear Laboratories, Chalk River, Ontario, Canada KOJ IJO;Department of Physics, Queen''s University, Kingston, Ontario, Canada K7L 3N6 |
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| Abstract: | Mean lifetimes of levels in 18F have been measured using the Doppler-shift attenuation method and the inverse reaction 3He(16O, p)18F. Targets of 3He implanted into Al, Nb, and Au foils were employed in the measurements. The Doppler-broadened lineshapes observed at 0° to the beam were analyzed to obtain the following lifetime values: 0.971 ± 0.030, 0.605 ± 0.029 and 0.435 ± 0.041 ps for the 1.70(1+), 2.52(2+) and 3.36(3+)MeV members of the Kπ = 1+ rotational band, 5.12 ± 0.56, 0.403 ± 0.018 and 1.91 ± 0.17 ps for the 2.10(2?), 3.13(1?) and 3.79(3?) MeV members of the Kπ = 0? bands, and 〈1.2, 2.7+4.1?2.7 and 20 ± 2 fs for the 3.06(2+, T = 1), 3.72(1+) and 3.84(2+) MeV states, respectively. |
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| Keywords: | Nuclear reactions |
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