首页 | 本学科首页   官方微博 | 高级检索  
     


Insights into fractal feature evolution from Au/Ge thin films after annealing
Authors:Z.W.?Chen  author-information"  >  author-information__contact u-icon-before"  >  mailto:cnzwchen@yahoo.com.cn"   title="  cnzwchen@yahoo.com.cn"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,S.Y.?Zhang,S.?Tan,J.G.?Hou,Z.Q.?Wu
Affiliation:(1) Structure Research Laboratory, University of Science and Technology of China, Hefei, 230026 Anhui, P.R. China;(2) Fundamental Physics Center, University of Science and Technology of China, Hefei, 230026 Anhui, P.R. China
Abstract:We report a perplexing behavior of fractal shape transition that results from a change in the annealing temperature and time or the film thickness ratio. We find that a compact-to-open fractal shape transition can be induced by increasing the annealing temperature and time or decreasing the thickness ratio of the Au and Ge films. This behavior is not completely consistent with what is predicted by theories based on diffusion-limited aggregation and previous experimental observations. In this new system, we find that fractal shape transitions are truly dominated by the random-successive nucleation and growth mechanism. PACS 61.43.Hv; 68.55.-a; 81.05.Gc
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号