Alpha particle track coloration in CR-39: Improved observability |
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Authors: | A.
zgü mü s A. Chambaudet |
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Affiliation: | Laboratoire de Microanalyses Nucléaires, U.F.R. Sciences et Techniques, Université de Franche-Comté, 16 route de Gray 25030, Besançon Cedex, France |
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Abstract: | A comparative study of the observability of alpha particle tracks in CR-39 was performed with an optical microscope before and after coloration. The implantation of ink helped in observing the damage zones. At first glance through the microscope, the coloration makes the tracks stand out right away. This coloration is helpful, from the start, in the morphological study of the tracks (size, area, orientation, shape, perimeter). This operation is advantageous in distinguishing the alpha particle tracks from stains or scratches. Thus, the routine counting of the tracks is more easily performed. Consequently, this procedure allowed us: to decrease significantly the standard deviation of the approximate total of the parameters given from the image analysis system (Olympus CUE2); to envision the possibility of reasonably decreasing the etching time in order to limit the loss of information caused by the destruction of the CR-39 during chemical etching and to use a weaker enlarging lens in order to cover a larger field of observation for the counting operations. |
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Keywords: | CR-39 SSNTD alpha particles tracks coloration observability microscopy shape |
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