Low energy electronic spectroscopy of an infinite-layer cuprate: A resonant inelastic X-ray scattering study of CaCuO2 |
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| Authors: | B Freelon A Augustsson J-H Guo PG Medaglia A Tebano G Balestrino CL Dong CL Chang PA Glans T Learmonth KE Smith J Nordgren Z Hussain |
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| Institution: | 1. Advanced Light Source, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS 7-100, Berkeley, CA 94720, USA;2. Department of Physics University of California, Berkeley, CA 94720, USA;3. CNR-INFM-COHERENTIA and Dipartimento di Ingegneria Meccanica, Università di Roma “Tor Vergata”, Via del Politecnico 1, I-00133 Roma, Italy;4. Department of Physics, Tamkang University, Tamsui, Taiwan, China;5. Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215, USA;6. Department of Physics, Uppsala University, 751 21 Uppsala, Sweden |
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| Abstract: | We report the results of Oxygen K-edge soft X-ray absorption and emission spectroscopy that was performed on an infinite-layer insulating cuprate thin film CaCuO2. Experimentally obtained spectra are consistent with local density approximation calculations. X-ray absorption spectra show a close resemblance to spectra obtained from homologous single crystal cuprates. In addition to d–d excitations, X-ray emission spectra reveal the presence of Zhang-Rice singlet states in the infinite-layer CuO2 planes. The question of whether the Zhang-Rice singlet features are masked by the O 2p main-band is addressed: it is possible to quantify the position of the Zhang-Rice singlet using emission intensity profiles. X-ray emission is demonstrated as a tool for understanding CuO2 planar electronic correlation in the prototypical infinite-layer. The energy difference, 2.0 eV, between the oxygen main-band and the Zhang-Rice singlet band is found to match values obtained theoretically using established planar electronic correlation parameters. |
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