Multiple transmission-reflection infrared spectroscopy for high-sensitivity measurement of molecular monolayers on silicon surfaces

A new infrared spectroscopic measurement involving multiple transmissions and reflections for molecular monolayers adsorbed on silicon surfaces has been established. Compared to the well-known multiple internal reflection (MIR) method, the distinctive advantage of multiple transmission-reflection infrared spectroscopy (MTR-IR) is the convenient measurement using standard silicon wafers as samples, while in the MIR setup special fabrication of geometric shapes such as 45 degrees bevel cuts on an attenuated total reflection silicon crystal is needed. Both p- and s-polarized spectra can be obtained reproducibly with the same order of sensitivity as by the MIR spectroscopy. Optimal conditions for spectral acquisition have been obtained from theoretical calculations. The ability of this methodology to gather high quality infrared spectra of adsorbed monolayers is demonstrated and the analysis of the surface packing and molecular orientation is discussed.