Moiré gauging by projected interference fringes |
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Authors: | J. Shamir |
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Affiliation: | 1. Siemens Research Laboratories, USA |
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Abstract: | The formation of Moiré patterns by doubly exposed photographs of projected interference fringes is analysed in detail. The possible applications of these patterns for the measurement of surface deformation and vibration, phase object visualization and height contouring are examined theoretically and experimentally.The described methods are closely related to holographic techniques, but they are usually simpler and applicable in unfavourable environments. |
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