Detection probability and detection time using clutter metrics |
| |
| Affiliation: | 1. Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;2. University of Chinese Academy of Sciences, Beijing 100049, China;3. Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China;1. Department of Industrial Engineering, University of Naples Federico II, Italy;2. Department of Energy, Information Engineering and Mathematical Models, University of Palermo, Italy |
| |
| Abstract: | We modified the structure similarity index, which is extensively used for image quality assessment, to be clutter metrics and call them target structure similarity measures (TSSIM). Two methods for calculating the TSSIM metrics were suggested. In this paper, via different mathematical formulas, the metrics are used to predict detection probabilities and detection times. The degrees of correlation between various clutter metrics and both the target detection probabilities and the mean detection times, which are obtained from the Search_2 dataset, are presented. Based on these data, comparisons between TSSIMs and three other typical clutter metrics are demonstrated. Experiment results show the TSSIMrms measure generates much better predictive capabilities for both the experimental detection probabilities and the mean detection times than other clutter measures being compared. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
