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A contactless method for investigating the thermal properties of thin films |
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| Authors: | A. Skumanich H. Dersch M. Fathallah N. M. Amer |
| Affiliation: | (1) IBM Almaden Research Center, 650 Harry Road, 95120-6099 San Jose, CA, USA;(2) BBC Forschungszentrum, Baden-Dattuil, Switzerland;(3) Physics Department, Faculty of Sciences, University of Tunis, Tunis, Tunisia;(4) IBM Watson Research Center, 10598 Yorktown Heights, NY, USA |
| Abstract: | The photothermal deflection technique has been extended as a contactless method to investigate thermal transport in thin films. A theoretical model is developed which quantitatively describes the transport behavior, and is shown to be in excellent agreement with experimental results. This approach yields the thermal diffusivity directly and in a spatially-resolved manner. |
| Keywords: | 65.90+i 68.55Wy 81.70+r |
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