Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods |
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| Authors: | A E Blagov N V Marchenkov Yu V Pisarevsky P A Prosekov M V Kovalchuk |
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| Institution: | 1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia
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| Abstract: | A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed. |
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