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Kinetic Monte Carlo simulation of low-pressure chemical vapor deposition of silicon nitride: Impact of gas flow rate and temperature on silicon cluster size and density
Institution:1. Département d?Electronique, Université de Jijel, BP98 Ouled Aissa, Jijel 18000, Algeria;2. Laboratoire d?Etude des Matériaux, Université de Jijel, BP98 Ouled Aissa, Jijel 18000, Algeria;1. Laboratoire LPR, Département de Physique, Faculté des Sciences, Université Badji Mokhtar, Annaba, Algeria;2. Laboratoire de Physique et d?électronique (LPE), Faculté des Sciences, Université, Libanaise, El Hadath, Beirut, Lebanon;3. Laboratoire de Physique Quantique et Modélisation Mathématique de la Matière (LPQ3M), Université de Mascara, 29000 Mascara, Algeria;1. Department of Chemistry, Dongguk University-Seoul, Seoul 100-715, Republic of Korea;1. Department of Physics, College of science, University of Basrah, Basrah, Iraq;2. School of Physics, Universiti Sains Malaysia, 11800 Pulau Penang, Malaysia
Abstract:In the present study, the deposition process of SiNx thin films obtained by a low-pressure chemical vapor deposition technique with a mixture of disilane (Si2H6) and ammonia (NH3) was simulated by using the kinetic Monte Carlo method. A new pattern describing the distribution of ammonia molecules in the simulation matrix was proposed. The influences of the NH3/Si2H6 gas flow ratio and the deposition temperature on the obtained films structure in terms of silicon cluster size and density were analyzed. The simulation results indicate that an increase in the gas flow ratio leads to the deposition of amorphous silicon clusters characterized by small sizes. Nevertheless, an increase in the temperature values of the process provokes an enhancement in the silicon cluster size along with a decrease in their density.
Keywords:Kinetic Monte Carlo  Silicon cluster  Cluster size
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