Exchange bias and domain evolution at 10 nm scales |
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Authors: | Schmid I Marioni M A Kappenberger P Romer S Parlinska-Wojtan M Hug H J Hellwig O Carey M J Fullerton E E |
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Institution: | Empa, Swiss Federal Institute for Materials Testing and Research, CH-8600 Dübendorf, Switzerland. |
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Abstract: | For a fixed 2 μm×2 μm area of a Co/Pt-CoO perpendicular exchange bias system we image the ferromagnetic (FM) domains for various applied fields with 10-nm resolution by magnetic force microscopy (MFM). Using quantitative MFM we measure the local areal density of pinned uncompensated spins (pinUCS) in the antiferromagnetic (AFM) CoO layer and correlate the FM domain structure with the UCS density. Larger applied fields drive the receding domains to areas of proportionally higher pinUCS aligned antiparallel to FM moments. The data confirm that the evolution of the FM domains is determined by the pinUCS in the AFM layer, and also present examples of frustration in the system. |
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