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Shrinkage drift parameter estimation for multi‐factor Ornstein–Uhlenbeck processes
Authors:Sévérien Nkurunziza  S Ejaz Ahmed
Institution:University of Windsor, 401 Sunset Avenue, Windsor, Ont., Canada N9B 3P4
Abstract:We consider some inference problems concerning the drift parameters of multi‐factors Vasicek model (or multivariate Ornstein–Uhlebeck process). For example, in modeling for interest rates, the Vasicek model asserts that the term structure of interest rate is not just a single process, but rather a superposition of several analogous processes. This motivates us to develop an improved estimation theory for the drift parameters when homogeneity of several parameters may hold. However, the information regarding the equality of these parameters may be imprecise. In this context, we consider Stein‐rule (or shrinkage) estimators that allow us to improve on the performance of the classical maximum likelihood estimator (MLE). Under an asymptotic distributional quadratic risk criterion, their relative dominance is explored and assessed. We illustrate the suggested methods by analyzing interbank interest rates of three European countries. Further, a simulation study illustrates the behavior of the suggested method for observation periods of small and moderate lengths of time. Our analytical and simulation results demonstrate that shrinkage estimators (SEs) provide excellent estimation accuracy and outperform the MLE uniformly. An over‐ridding theme of this paper is that the SEs provide powerful extensions of their classical counterparts. Copyright © 2009 John Wiley & Sons, Ltd.
Keywords:Ornstein–  Uhlenbeck process  Vasicek process  Gaussian process  shrinkage estimator  MLE  diffusion process
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