| Profound Carrier-Envelope-Phase-Difference Effect on Photoionization Rate： Numerical Results on a Model Hydrogen Atom |
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| 作者姓名： | 周瑜 张贵忠 向望华 W. T. Hill III |
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| 作者单位： | [1]College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072 [2]Key Laboratory of Opto-Electronic Information Technical Science （Ministry of Education）, Tianjin University, 300072 [3]Institute for Physical Science and Technology, University of Maryland at College Park, MD 20742, USA |
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| 基金项目： | Supported by Tianjin Commission of Science and Technology under Grant No 013601011. |
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| 摘 要： | We discuss importance of the carrier-envelope phase difference （CEPD） effect which would be encountered in real short laser pulses. By numerically simulating photoionization rate of a one-dimensional atomic hydrogen model irradiated by short light pulses, a profound CEPD effect on the photoionization rate is revealed, which might shed light on laser-atom interaction investigation. We also suggest that photoionization process might be exploited in return to measure CEPD values.
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| 关 键 词： | 光致电离 氢原子 激光脉冲 CEPD 同位素 |
| 收稿时间： | 2005-05-25 |
| 修稿时间： | 2005-05-25 |
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