The electronic structure of SiO2, GeO2 and intermediate SixGe1−xO2 compositions: experiment and theory |
| |
Authors: | Sokrates T. Pantelides Bernhard Fischer Roger A. Pollak Thomas H. Di Stefano |
| |
Affiliation: | IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA |
| |
Abstract: | Theoretical calculations are reported for SiO2, GeO2 and the intermediate composition Si.5Ge.5O2 which reproduce the main observed features and trends in experimental photoemission spectra. The agreement between the two establishes the importance of band theory in understanding the electronic structure of these materials, and demonstrates that detailed quantitative predictions are feasible for such complex materials in terms of the empirical tight-binding method. The calculations further establish that the structure in the valence bands is determined mainly by nearest- neighbor oxygen-oxygen interactions. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|