Investigation of low-voltage on-resonance ion selection for Fourier transform mass spectrometry

Low-voltage on-resonance ion selection (LOIS) was recently introduced as an alternative technique for ion selection and storage. Under high pressure conditions and similar to the technique of quadrupolar axialization, unwanted (unselected) trapped ions are eliminated from the analysis cell through collisions with cell plates following orbital expansion. The ions remaining after tens of seconds of mass selection can be detected with better coherence, leading to improvements in ion detection and sensitivity. Here, experiments designed to test ion remeasurement and ion transfer capabilities are presented. Simulations of ion motion give insight into the possible mechanism of ion cooling, which does not appear to be the same as that of the axialization process. Because of its ease of use, lack of need for additional hardware devices, and comparable ion selection results, LOIS is an attractive alternative for trapped ion experiments.