The outlook for X-ray diffraction topography

The possibilities of high-resolution X-ray section topography using the geometry of the interference bands to reveal features of the elastic fields of crystalline lattice defects are considered. The mechanisms of the diffraction of the X-ray wavefield on elastic lattice distortions are demonstrated using the example of dislocations. Microdefects in silicon are another most interesting subject. Section topography is in this case virtually the only method for revealing very weak deformations due to microdefects.