Characterization of electroplated ZnTe coatings |
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Authors: | T Mahalingam V Dhanasekaran K Sundaram A Kathalingam Jin-Koo Rhee |
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Institution: | (1) Department of Physics, Alagappa University, Karaikudi, 630-003, India;(2) Millimeter-wave Innovation Technology Research Center (MINT), Dongguk University, Seoul, 100-715, Republic of Korea |
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Abstract: | Zinc telluride (ZnTe) layers have been grown on conducting glass substrates using an electrochemical technique and characterized
using cyclic voltammetry, X-ray diffractions, UV–vis-near infrared spectroscopy, and scanning electron microscopy (SEM). The
reaction kinetics of binary film formation is also discussed. Cyclic voltammetry experiments were performed to elucidate the
electrodic processes that occurred when potentials were applied and the optimum potential for electrodeposition were determined.
X-ray diffraction studies revealed that the deposited films were polycrystalline in nature with zinc blende cubic structure.
The various microstructural parameters were calculated using structural studies. The optical transmission and reflection spectrum
were recorded and direct transition band gap energy is estimated about 2.26 eV by Tauc’s plot. The SEM pictures revealed that
the nanoneedles protruding from nanorods with bunches of atoms agglomerate each other. The energy dispersive analysis by X-rays
spectrum revealed the stoichiometry composition of ZnTe thin film at optimized preparative parameters. |
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